Non-contact Terahertz Imaging of Semiconductor Junctions (heise.de)

• Terahertz wave application for non-invasive semiconductor analysis
• In-situ imaging of active p-n junctions
• Capability to penetrate protective packaging layers

"Researchers have demonstrated a method to visualize p-n junctions in semiconductors under operating conditions and through packaging using terahertz spectroscopy. This non-destructive technique allows for the inspection of internal semiconductor dynamics without requiring physical contact, although the current implementation is primarily suited for larger-scale structures."